Direct observation of insulators with a scanning electron microscope
P. Morin, M. Pitaval, E. Vicario
Abstract
Open-access reader
P. Morin, M. Pitaval, E. Vicario
Abstract
Open-access reader
A low energy electron gun is used to discharge insulating specimens during observation with a scanning electron microscope. The apparatus includes essentially the gun, an optical microscope, a supplementary grid before the electron detector, and a video signal chopper. Either topographic, chemical, crystallographic or potential contrasts can be observed with a high energy (30 keV) electron probe; observation of insulators under deformation is possible.
OpenAlex reports 17 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
A low energy electron gun is used to discharge insulating specimens during observation with a scanning electron microscope. The apparatus includes essentially the gun, an optical microscope, a supplementary grid before the electron detector, and a video signal chopper. Either topographic, chemical, crystallographic or potential contrasts can be observed with a high energy (30 keV) electron probe; observation of insulators under deformation is possible.
Key concepts: Low-voltage electron microscope, Electron beam-induced deposition, Scanning electron microscope, Conventional transmission electron microscope, Chopper, Materials science, Electron microscope, Microscope