2015•Unpublished venueRequires access
Scanning Conductive Torsion Mode Microscopy
Ling Sun, Elmar Bonaccurso
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Abstract
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Ling Sun, Elmar Bonaccurso
Abstract
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Key concepts: Scanning probe microscopy, Scanning gate microscopy, Materials science, Nanopillar, Conductive atomic force microscopy, Scanning ion-conductance microscopy, Electrical conductor, Nanotechnology