2013Unpublished venueRequires access

Intrinsic retention statistics in phase change memory (PCM) arrays

Marco Rizzi, Nicola Ciocchini, A. Montefiori, Massimo Ferro, Paolo Fantini, Andrea Leonardo Lacaita, Daniele Ielmini

Open publisher page 7 citations

Abstract

Introduction: Recently, phase change memory (PCM) has entered the commercial stage in a 45 nm technology [1]. To better assess the potential scaling and application as embedded memory [2], data retention and its statistics must be carefully understood and optimized. This work studies crystallization statistics in 1 Gb arrays of PCM devices. We evidence (i) retention stabilization by tuning of the programming conditions, and (ii) erratic retention due to crystallization variability. A new retention model is developed, which is capable of predicting cell-to-cell and cycle-to-cycle variability as a function of programming conditions.

About this research paper

What this paper is about

Introduction: Recently, phase change memory (PCM) has entered the commercial stage in a 45 nm technology [1]. To better assess the potential scaling and application as embedded memory [2], data retention and its statistics must be carefully understood and optimized. This work studies crystallization statistics in 1 Gb arrays of PCM devices. We evidence (i) retention stabilization by tuning of the programming conditions, and (ii) erratic retention due to crystallization variability. A new retention model is developed, which is capable of predicting cell-to-cell and cycle-to-cycle variability as a function of programming conditions.

Why it matters

OpenAlex reports 7 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

Introduction: Recently, phase change memory (PCM) has entered the commercial stage in a 45 nm technology [1]. To better assess the potential scaling and application as embedded memory [2], data retention and its statistics must be carefully understood and optimized. This work studies crystallization statistics in 1 Gb arrays of PCM devices. We evidence (i) retention stabilization by tuning of the programming conditions, and (ii) erratic retention due to crystallization variability. A new retention model is developed, which is capable of predicting cell-to-cell and cycle-to-cycle variability as a function of programming conditions.

Key concepts: Data retention, Phase-change memory, Scaling, Computer science, Crystallization, Retention time, Non-volatile memory, Function (biology)

Related papers

Back to paper searchBrowse research topicsOriginal source
Intrinsic retention statistics in phase change memory (PCM) arrays — Research Paper | ScholarLens