2011•UltramicroscopyRequires access

Interlaboratory round robin on cantilever calibration for AFM force spectroscopy

Joost te Riet, Allard J. Katan, Christian Rankl, Stefan Ståhl, Arend M. van Buul, In Yee Phang, Alberto Gómez-Casado, Peter M. Schön, Jan Willem Gerritsen, Alessandra Cambi, Alan E. Rowan, Gyula Julius Vancso, Pascal Jonkheijm, Jurriaan Huskens, Tjerk H. Oosterkamp, Hermann E. Gaub, Peter Hinterdorfer, Carl Gustav Figdor, S. Speller

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Key concepts: Cantilever, Force spectroscopy, Calibration, Spring (device), Atomic force microscopy, Spectroscopy, Materials science, Noise (video)