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Improved Force Spectroscopy Using Focused-Ion-Beam-Modified Cantilevers

Jaevyn K. Faulk, Devin T. Edwards, Matthew S. Bull, Thomas T. Perkins

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Key concepts: Cantilever, Force spectroscopy, Nanotechnology, Nanomechanics, Materials science, Atomic force microscopy, Focused ion beam, Stiffness

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