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1997•IEE Proceedings - OptoelectronicsRequires access

Semiconductor laser linewidth from the transmission-line laser model

Yao-ban Chan, Malin Premaratne, Arthur J. Lowery

Open publisher page 5 citations

Abstract

Two methods for determining semiconductor laser linewidth using the transmission-line laser model (TLLM) are developed. The first is a semianalytical method suitable for DFB lasers. The second uses Fourier transforms to extract the laser spectrum from the simulated optical field, and is suitable for any laser structure. A technique for increasing the accuracy of this second method has been developed. Extensive comparisons with previous work verify the accuracy of both methods.

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What this paper is about

Two methods for determining semiconductor laser linewidth using the transmission-line laser model (TLLM) are developed. The first is a semianalytical method suitable for DFB lasers. The second uses Fourier transforms to extract the laser spectrum from the simulated optical field, and is suitable for any laser structure. A technique for increasing the accuracy of this second method has been developed. Extensive comparisons with previous work verify the accuracy of both methods.

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OpenAlex reports 5 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

Two methods for determining semiconductor laser linewidth using the transmission-line laser model (TLLM) are developed. The first is a semianalytical method suitable for DFB lasers. The second uses Fourier transforms to extract the laser spectrum from the simulated optical field, and is suitable for any laser structure. A technique for increasing the accuracy of this second method has been developed. Extensive comparisons with previous work verify the accuracy of both methods.

Key concepts: Laser linewidth, Laser, Optics, Semiconductor laser theory, Distributed feedback laser, Semiconductor, Materials science, Transmission (telecommunications)

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