2004Microscopy and MicroanalysisRequires access

Simultaneous Amplitude and Phase Contrast Imaging with a Segmented Detector in Scanning Transmission X-ray Microscopy

Benjamin Hornberger, Chris Jacobsen, Michael Feser

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

About this research paper

What this paper is about

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Why it matters

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Available abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Key concepts: Phase-contrast imaging, Phase contrast microscopy, Optics, Contrast (vision), Detector, Materials science, Microscopy, Phase (matter)

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