1983•Applied Physics LettersRequires access

Secondary electron emission from uranium surfaces due to bombardment by high-energy ions

Haolin Chen, R. Solarz, Gaylen V. Erbert

Abstract

The secondary emission of electrons from uranium surfaces was studied as a function of energy and type of the bombarding ions in the range 1.0–5.0 keV. The value of the secondary electron yield (i.e., the number of electrons ejected from a surface per impinging ion) was found to increase linearly with increasing ion energy and to scale roughly as the inverse square root of the mass of impinging ions.

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Key concepts: Ion, Atomic physics, Electron, Secondary electrons, Uranium, Secondary emission, Range (aeronautics), Yield (engineering)