Secondary Electron Emission from Dielectric Materials of a Hall Thruster with Segmented Electrodes
A. Dunaevsky, Yevgeny Raitses, N. J. Fisch
Abstract
Open-access reader
A. Dunaevsky, Yevgeny Raitses, N. J. Fisch
Abstract
Open-access reader
The discharge parameters in Hall thrusters depend strongly on the yield of secondary electron emission from channel walls. Comparative measurements of the yield of secondary electron emission at low energies of primary electrons were performed for several dielectric materials used in Hall thrusters with segmented electrodes. The measurements showed that at low energies of primary electrons the actual energetic dependencies of the total yield of secondary electron emission could differ from fits, which are usually used in theoretical models. The observed differences might be caused by electron backscattering, which is dominant at lower energies and depends strongly on surface properties. Fits based on power or linear laws are relevant at higher energies of primary electrons, where the bulk material properties play a decisive role.
OpenAlex reports 4 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
The discharge parameters in Hall thrusters depend strongly on the yield of secondary electron emission from channel walls. Comparative measurements of the yield of secondary electron emission at low energies of primary electrons were performed for several dielectric materials used in Hall thrusters with segmented electrodes. The measurements showed that at low energies of primary electrons the actual energetic dependencies of the total yield of secondary electron emission could differ from fits, which are usually used in theoretical models. The observed differences might be caused by electron backscattering, which is dominant at lower energies and depends strongly on surface properties. Fits based on power or linear laws are relevant at higher energies of primary electrons, where the bulk material properties play a decisive role.
Key concepts: Secondary emission, Electron, Secondary electrons, Atomic physics, Yield (engineering), Dielectric, Electrode, Hall effect