Vertical power diodes in bulk GaN
Don Disney, Hui Nie, Andrew P. Edwards, David Bour, Hemal Shah, Isik C. Kizilyalli
Abstract
Don Disney, Hui Nie, Andrew P. Edwards, David Bour, Hemal Shah, Isik C. Kizilyalli
Abstract
Vertical diodes with breakdown voltages up to 2.6kV have been fabricated on bulk GaN substrates. The measured figures-of-merit of these devices show performance near the theoretical limit of GaN. These vertical GaN diodes exhibit robust avalanche breakdown behavior with a positive temperature coefficient. System-level performance advantages have been demonstrated in power conversion applications. Statistical data have been collected from thousands of devices. Initial reliability tests have been completed.
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Vertical diodes with breakdown voltages up to 2.6kV have been fabricated on bulk GaN substrates. The measured figures-of-merit of these devices show performance near the theoretical limit of GaN. These vertical GaN diodes exhibit robust avalanche breakdown behavior with a positive temperature coefficient. System-level performance advantages have been demonstrated in power conversion applications. Statistical data have been collected from thousands of devices. Initial reliability tests have been completed.
Key concepts: Diode, Materials science, Breakdown voltage, Optoelectronics, Reliability (semiconductor), Figure of merit, Gallium nitride, Wide-bandgap semiconductor