2015•UltramicroscopyRequires access

HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy

Williams Lefebvre, David Hernández‐Maldonado, F. Moyon, Fabien Cuvilly, Charly Vaudolon, D. K. Shinde, F. Vurpillot

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Key concepts: Atom probe, Scanning transmission electron microscopy, Electron tomography, Tomography, Materials science, Atomic units, Deconvolution, Dark field microscopy

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HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy — Research Paper | ScholarLens