A New Approach for Electron Tomography: Annular Dark‐Field Transmission Electron Microscopy
Sara Bals, G. Van Tendeloo, C. Kisielowski
Abstract
Sara Bals, G. Van Tendeloo, C. Kisielowski
Abstract
Annular dark-field transmission electron microscopy uses an annular objective aperture that blocks the central beam and all electrons scattered up to a certain semiangle. A contrast suitable for electron tomography is generated and 3D reconstructions of CdTe tetrapods and C nanotubes (see figure) are successfully obtained. With short exposure times and high contrast, the technique could be useful not only for materials science, but also for biological applications.
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Annular dark-field transmission electron microscopy uses an annular objective aperture that blocks the central beam and all electrons scattered up to a certain semiangle. A contrast suitable for electron tomography is generated and 3D reconstructions of CdTe tetrapods and C nanotubes (see figure) are successfully obtained. With short exposure times and high contrast, the technique could be useful not only for materials science, but also for biological applications.
Key concepts: Electron tomography, Dark field microscopy, Materials science, Electron, Transmission electron microscopy, Scanning transmission electron microscopy, Energy filtered transmission electron microscopy, Optics