2006Advanced MaterialsRequires access

A New Approach for Electron Tomography: Annular Dark‐Field Transmission Electron Microscopy

Sara Bals, G. Van Tendeloo, C. Kisielowski

Open publisher page 71 citations

Abstract

Annular dark-field transmission electron microscopy uses an annular objective aperture that blocks the central beam and all electrons scattered up to a certain semiangle. A contrast suitable for electron tomography is generated and 3D reconstructions of CdTe tetrapods and C nanotubes (see figure) are successfully obtained. With short exposure times and high contrast, the technique could be useful not only for materials science, but also for biological applications.

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What this paper is about

Annular dark-field transmission electron microscopy uses an annular objective aperture that blocks the central beam and all electrons scattered up to a certain semiangle. A contrast suitable for electron tomography is generated and 3D reconstructions of CdTe tetrapods and C nanotubes (see figure) are successfully obtained. With short exposure times and high contrast, the technique could be useful not only for materials science, but also for biological applications.

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OpenAlex reports 71 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

Annular dark-field transmission electron microscopy uses an annular objective aperture that blocks the central beam and all electrons scattered up to a certain semiangle. A contrast suitable for electron tomography is generated and 3D reconstructions of CdTe tetrapods and C nanotubes (see figure) are successfully obtained. With short exposure times and high contrast, the technique could be useful not only for materials science, but also for biological applications.

Key concepts: Electron tomography, Dark field microscopy, Materials science, Electron, Transmission electron microscopy, Scanning transmission electron microscopy, Energy filtered transmission electron microscopy, Optics

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