A 16K CMOS EPROM
Peng Cheng, Yiu-Fai Chan, V. V. Levchenko
Abstract
Peng Cheng, Yiu-Fai Chan, V. V. Levchenko
Abstract
THE CONTINUED NEED for low-power, high density- and high programming circuit which clamps the programming voltage Vd performance CMOS EPROMs has been established by the evolution of faster and denser low-power microprocessors, and their dependence on convenient program storage memories. This need was first served by the 4K CMOS EPROM1,2, implemented by a two transistor P-channel floating-gate cell. A second-generation 2Kx8 CMOS EPROM has been developed featuring a dual polysilicon N-channel EPROM cell3 which is a one-transistor cell fabricated in the P-well of a CMOS process; Figure 1. Microwatt standby power has been achieved by utilizing synchronous design on an oxide isolated ion-implanted silicon-gate CMOS technology.
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THE CONTINUED NEED for low-power, high density- and high programming circuit which clamps the programming voltage Vd performance CMOS EPROMs has been established by the evolution of faster and denser low-power microprocessors, and their dependence on convenient program storage memories. This need was first served by the 4K CMOS EPROM1,2, implemented by a two transistor P-channel floating-gate cell. A second-generation 2Kx8 CMOS EPROM has been developed featuring a dual polysilicon N-channel EPROM cell3 which is a one-transistor cell fabricated in the P-well of a CMOS process; Figure 1. Microwatt standby power has been achieved by utilizing synchronous design on an oxide isolated ion-implanted silicon-gate CMOS technology.
Key concepts: EPROM, CMOS, Electrical engineering, Transistor, Standby power, Threshold voltage, Low-power electronics, Gate oxide