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2011•Microelectronics ReliabilityRequires access

Characterization and modeling of hot carrier injection in LDMOS for L-band radar application

Ludovic Lachèze, Olivier Latry, Pascal Dherbécourt, K. Mourgues, Viswas Purohit, Hichame Maanane, J.P. Sipma, F. Cornu, Philippe Eudeline

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Key concepts: LDMOS, Materials science, Transistor, Figure of merit, Degradation (telecommunications), Optoelectronics, Radar, Electronic engineering

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Characterization and modeling of hot carrier injection in LDMOS for L-band radar application — Research Paper | ScholarLens