Evidence for the superconducting proximity effect in junctions between the surfaces of YBa2Cu3Ox thin films
John Moreland, R.H. Ono, J. A. Beall, M. Madden, A. J. Nelson
Abstract
John Moreland, R.H. Ono, J. A. Beall, M. Madden, A. J. Nelson
Abstract
We have used the squeezable electron tunneling junction technique for testing the electrical properties of the surfaces of YBa2Cu3Ox (YBCO) thin-film electrodes. As deposited and annealed, the surfaces of the electrodes were insulating at 4 K. Several methods were used to improve the electrical properties of the electrodes’ surfaces including rapid thermal annealing, oxygen sputter etching, and thin Ag coating treatments. The greatest improvement occurred after a deposition of a 5 nm Ag coating and subsequent rapid thermal anneal of one set of YBCO films. Under these conditions it was possible to make a superconducting Josephson point contact between the surfaces of the electrodes. We think that the Ag acts as a normal-metal proximity layer effectively shunting the degraded electrodes’ surfaces.
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We have used the squeezable electron tunneling junction technique for testing the electrical properties of the surfaces of YBa2Cu3Ox (YBCO) thin-film electrodes. As deposited and annealed, the surfaces of the electrodes were insulating at 4 K. Several methods were used to improve the electrical properties of the electrodes’ surfaces including rapid thermal annealing, oxygen sputter etching, and thin Ag coating treatments. The greatest improvement occurred after a deposition of a 5 nm Ag coating and subsequent rapid thermal anneal of one set of YBCO films. Under these conditions it was possible to make a superconducting Josephson point contact between the surfaces of the electrodes. We think that the Ag acts as a normal-metal proximity layer effectively shunting the degraded electrodes’ surfaces.
Key concepts: Materials science, Thin film, Electrode, Sputtering, Josephson effect, Superconductivity, Annealing (glass), Optoelectronics