T.L. Turflinger
Abstract
Analog and mixed-signal integrated circuits are also susceptible to single-event effects, but they have rarely been tested. Analog circuit single-particle transients require modified test techniques and data analysis. Existing work is reviewed and future concerns are outlined.
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Analog and mixed-signal integrated circuits are also susceptible to single-event effects, but they have rarely been tested. Analog circuit single-particle transients require modified test techniques and data analysis. Existing work is reviewed and future concerns are outlined.
Key concepts: Mixed-signal integrated circuit, Analogue electronics, Analog signal, Electronic circuit, Electronic engineering, Integrated circuit, SIGNAL (programming language), Event (particle physics)