High speed analog signal tester

This paper describes a new high speed analog signal testing technique that can be used to characterize high speed analog signals in an integrated circuit (IC). The procedure can be implemented on an IC to be tested with the addition of two simple components. The end result is that high speed analog signals can be sampled and brought off-chip to be stored in some manner. The authors discuss the CMOS4S and BiCMOS analog signal testers.