1994International Journal of ElectronicsRequires access

Negative resistance characteristics of Zener diode at onset of avalanche breakdown

Haibo Zhang, AKFO TAKAOKA, Katsumi Ura

Open publisher page 2 citations

Abstract

In a low current region (∼100μA) within a narrow voltage near the onset of primary breakdown, a negative resistance effect has been observed in a 4 kV high-voltage Zener diode. The region is much lower than ihe secondary breakdown region (∼ 100 mA) where negative resistance phenomena have previously been reported for Zener diodes. Measured I—V and oscillation characteristics of high-and low-voltage (<200 V) Zener diodes in the low current region are described, confirming the presence of negative resistance.

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What this paper is about

In a low current region (∼100μA) within a narrow voltage near the onset of primary breakdown, a negative resistance effect has been observed in a 4 kV high-voltage Zener diode. The region is much lower than ihe secondary breakdown region (∼ 100 mA) where negative resistance phenomena have previously been reported for Zener diodes. Measured I—V and oscillation characteristics of high-and low-voltage (<200 V) Zener diodes in the low current region are described, confirming the presence of negative resistance.

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Available abstract

In a low current region (∼100μA) within a narrow voltage near the onset of primary breakdown, a negative resistance effect has been observed in a 4 kV high-voltage Zener diode. The region is much lower than ihe secondary breakdown region (∼ 100 mA) where negative resistance phenomena have previously been reported for Zener diodes. Measured I—V and oscillation characteristics of high-and low-voltage (<200 V) Zener diodes in the low current region are described, confirming the presence of negative resistance.

Key concepts: Zener diode, Avalanche diode, Breakdown voltage, Diode, Materials science, Avalanche breakdown, Oscillation (cell signaling), Negative resistance

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