2004•Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIERequires access

Analysis of variations of the thickness-phase objects by lateral shearing interferometry and white light scanning interferometry

Hernando Altamar-Mercado, Arturo Plata

Abstract

The interferometric techniques of lateral shearing and white light scanning interferometry are combined to determine the variations of thickness of phase objects and the thickness of such objects is approximated through B-splines functions.

About this research paper

What this paper is about

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

Key concepts: Interferometry, White light interferometry, Shearing (physics), Optics, White light, Shearing interferometer, Phase (matter), Materials science