First results of outgas resist family test and correlation between outgas specifications and EUV resist development
Yu-Jen Fan, Ken Maruyama, Ramakrishnan Ayothi, Takehiko Naruoka, Tonmoy Chakraborty, Dominic Ashworth, Jun Sung Chun, Cecilia Montgomery, Shih-Hui Jen, Mark O. Neisser, Kevin D. Cummings
Abstract