Measurement of linewidth enhancement factor of different semiconductor lasers in operating conditions
G. Giuliani, Silvano Donati, Wolfgang Elsäßer
Abstract
G. Giuliani, Silvano Donati, Wolfgang Elsäßer
Abstract
We apply the self-mixing method for the measurement of the linewidth enhancement factor of several types of semiconductor lasers. The α-factor value above threshold is determined by analysing the small perturbations that occur to the laser when it is subjected to moderate optical feedback, relying on the well-known Lang-Kobayashi equations. The method is applied to Fabry-Perot, VCSEL, External Cavity Laser (ECL), DFB, Quantum Cascade Laser. It is found that for some lasers the α-factor varies with the emitted power, and these variations can be correlated with variations in the laser linewidth.
OpenAlex reports 14 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
We apply the self-mixing method for the measurement of the linewidth enhancement factor of several types of semiconductor lasers. The α-factor value above threshold is determined by analysing the small perturbations that occur to the laser when it is subjected to moderate optical feedback, relying on the well-known Lang-Kobayashi equations. The method is applied to Fabry-Perot, VCSEL, External Cavity Laser (ECL), DFB, Quantum Cascade Laser. It is found that for some lasers the α-factor varies with the emitted power, and these variations can be correlated with variations in the laser linewidth.
Key concepts: Laser linewidth, Laser, Semiconductor laser theory, Injection seeder, Optoelectronics, Optics, Quantum dot laser, Vertical-cavity surface-emitting laser