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Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source

Y. Cao, Lixin Sun, Liyao Ma, B. H. Ma, H. Wang, Y. C. Feng, J. Y. Li, H. W. Zhao, Z. M. Zhang, X. Z. Zhang, Wenlong He, H. Y. Zhao, Xuan Guo, Xinhao Li

Open publisher page 5 citations

Abstract

With a latest developed electric-sweep scanner system, we have done a lot of experiments for studying this scanner system and ion beam emittance of electron cyclotron resonance (ECR) ion source. The electric-sweep scanner system was installed on the beam line of Lanzhou electron resonance ion source No. 3 experimental platform of Institute of Modern Physics. The repetition experiments have proven that the system is a relatively dependable and reliable emittance scanner, and its experiment error is about 10%. We have studied the influences of the major parameters of ECR ion source on the extracted ion beam emittance. The typical results of the experiments and the conclusions are presented in this article.

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What this paper is about

With a latest developed electric-sweep scanner system, we have done a lot of experiments for studying this scanner system and ion beam emittance of electron cyclotron resonance (ECR) ion source. The electric-sweep scanner system was installed on the beam line of Lanzhou electron resonance ion source No. 3 experimental platform of Institute of Modern Physics. The repetition experiments have proven that the system is a relatively dependable and reliable emittance scanner, and its experiment error is about 10%. We have studied the influences of the major parameters of ECR ion source on the extracted ion beam emittance. The typical results of the experiments and the conclusions are presented in this article.

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Available abstract

With a latest developed electric-sweep scanner system, we have done a lot of experiments for studying this scanner system and ion beam emittance of electron cyclotron resonance (ECR) ion source. The electric-sweep scanner system was installed on the beam line of Lanzhou electron resonance ion source No. 3 experimental platform of Institute of Modern Physics. The repetition experiments have proven that the system is a relatively dependable and reliable emittance scanner, and its experiment error is about 10%. We have studied the influences of the major parameters of ECR ion source on the extracted ion beam emittance. The typical results of the experiments and the conclusions are presented in this article.

Key concepts: Thermal emittance, Electron cyclotron resonance, Ion source, Scanner, Ion, Beam (structure), Beam emittance, Ion beam

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Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source — Research Paper | ScholarLens