2013Review of Scientific InstrumentsRequires access

Influence of injection beam emittance on beam transmission efficiency in a cyclotron

Satoshi Kurashima, H. Kashiwagi, Nobumasa Miyawaki, Kenichi Yoshida, Susumu Okumura

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Abstract

The JAEA AVF cyclotron accelerates various kinds of high-energy ion beams for research in biotechnology and materials science. Beam intensities of an ion species of the order of 10(-9)-10(-6) ampere are often required for various experiments performed sequentially over a day. To provide ion beams with sufficient intensity and stability, an operator has to retune an ion source in a short time. However, the beam intensity downstream of the cyclotron rarely increases in proportion to the intensity at the ion source. To understand the cause of this beam behavior, transmission efficiencies of a (12)C(5+) beam from an electron cyclotron resonance ion source to the cyclotron were measured for various conditions of the ion source. Moreover, a feasible region for acceleration in the emittance of the injection beam was clarified using a transverse-acceptance measuring system. We confirmed that the beam emittance and profile were changed depending on the condition of the ion source and that matching between the beam emittance and the acceptance of the cyclotron was degraded. However, after fine-tuning to improve the matching, beam intensity downstream of the cyclotron increased.

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What this paper is about

The JAEA AVF cyclotron accelerates various kinds of high-energy ion beams for research in biotechnology and materials science. Beam intensities of an ion species of the order of 10(-9)-10(-6) ampere are often required for various experiments performed sequentially over a day. To provide ion beams with sufficient intensity and stability, an operator has to retune an ion source in a short time. However, the beam intensity downstream of the cyclotron rarely increases in proportion to the intensity at the ion source. To understand the cause of this beam behavior, transmission efficiencies of a (12)C(5+) beam from an electron cyclotron resonance ion source to the cyclotron were measured for various conditions of the ion source. Moreover, a feasible region for acceleration in the emittance of the injection beam was clarified using a transverse-acceptance measuring system. We confirmed that the beam emittance and profile were changed depending on the condition of the ion source and that matching between the beam emittance and the acceptance of the cyclotron was degraded. However, after fine-tuning to improve the matching, beam intensity downstream of the cyclotron increased.

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Available abstract

The JAEA AVF cyclotron accelerates various kinds of high-energy ion beams for research in biotechnology and materials science. Beam intensities of an ion species of the order of 10(-9)-10(-6) ampere are often required for various experiments performed sequentially over a day. To provide ion beams with sufficient intensity and stability, an operator has to retune an ion source in a short time. However, the beam intensity downstream of the cyclotron rarely increases in proportion to the intensity at the ion source. To understand the cause of this beam behavior, transmission efficiencies of a (12)C(5+) beam from an electron cyclotron resonance ion source to the cyclotron were measured for various conditions of the ion source. Moreover, a feasible region for acceleration in the emittance of the injection beam was clarified using a transverse-acceptance measuring system. We confirmed that the beam emittance and profile were changed depending on the condition of the ion source and that matching between the beam emittance and the acceptance of the cyclotron was degraded. However, after fine-tuning to improve the matching, beam intensity downstream of the cyclotron increased.

Key concepts: Thermal emittance, Cyclotron, Beam (structure), Ion source, Fourier transform ion cyclotron resonance, Ion beam, Electron cyclotron resonance, Beam emittance

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