Structure analysis of the single-domain Si(111)4 × 1-In surface by μ-probe Auger electron diffraction and μ-probe reflection high energy electron diffraction
N. Nakamura, K. Anno, S. Kono
Abstract
N. Nakamura, K. Anno, S. Kono
Abstract
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Key concepts: Reflection high-energy electron diffraction, Electron diffraction, Low-energy electron diffraction, Diffraction, Electron backscatter diffraction, Reflection (computer programming), Chemistry, Kikuchi line