An Integrating Sphere for Measuring Diffuse Reflectance in the Near Infrared
John A. Jacquez, Wayne McKeehan, John Huss, James M. Dimitroff, Hans F. Kuppenheim
Abstract
John A. Jacquez, Wayne McKeehan, John Huss, James M. Dimitroff, Hans F. Kuppenheim
Abstract
The construction and performance of a 414-in. diameter comparison type integrating sphere for a spectrophotometer designed by W. L. Derksen and T. I. Monahan is described. This combination allows the measurement of diffuse spectral reflectance in the near infrared to 2.6μ with an accuracy of 1%.
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The construction and performance of a 414-in. diameter comparison type integrating sphere for a spectrophotometer designed by W. L. Derksen and T. I. Monahan is described. This combination allows the measurement of diffuse spectral reflectance in the near infrared to 2.6μ with an accuracy of 1%.
Key concepts: Integrating sphere, Diffuse reflection, Diffuse reflectance infrared fourier transform, Infrared, Optics, Reflectivity, Materials science, Near-infrared spectroscopy