2002•Acta MaterialiaOpen access

Utilizing the SIMS technique in the study of grain boundary diffusion along twist grain boundaries in the Cu(Ni) system

Stephen Schwarz

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Key concepts: Grain boundary, Materials science, Grain boundary diffusion coefficient, Twist, Effective diffusion coefficient, Diffusion, Secondary ion mass spectrometry, Activation energy

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Utilizing the SIMS technique in the study of grain boundary diffusion along twist grain boundaries in the Cu(Ni) system — Research Paper | ScholarLens