2012•Journal of Electronic TestingRequires access

Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits

J. Freijedo, J. Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, J.P. Teixeira

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Key concepts: Robustness (evolution), Electronic circuit, Process variation, Electronic engineering, Digital electronics, Field-programmable gate array, Voltage, CMOS

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