2014•Microelectronics ReliabilityRequires access

Subthreshold behavior models for short-channel junctionless tri-material cylindrical surrounding-gate MOSFET

Cong Li, Yiqi Zhuang, Ru Han, Gang Jin

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Key concepts: Subthreshold conduction, MOSFET, Subthreshold slope, Materials science, Optoelectronics, Channel (broadcasting), Gate oxide, Drain-induced barrier lowering

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