SOI bonded wafer process for high precision MEMS inertial sensors
William D. Sawyer, Mert S. Prince, Giles J Brown
Abstract
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William D. Sawyer, Mert S. Prince, Giles J Brown
Abstract
Open-access reader
A process for fabricating MEMS devices using a silicon on insulator (SOI) wafer bonded to a substrate glass or silicon wafer is presented. In this process, the device layer of the SOI wafer is bonded to the substrate wafer, and the handle and SiO 2 layers of the SOI wafer are subsequently removed. This method of manufacturing MEMS devices using SOI wafers offers important advantages over alternative SOI wafer processes, and is being implemented to manufacture high accuracy MEMS inertial devices.
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A process for fabricating MEMS devices using a silicon on insulator (SOI) wafer bonded to a substrate glass or silicon wafer is presented. In this process, the device layer of the SOI wafer is bonded to the substrate wafer, and the handle and SiO 2 layers of the SOI wafer are subsequently removed. This method of manufacturing MEMS devices using SOI wafers offers important advantages over alternative SOI wafer processes, and is being implemented to manufacture high accuracy MEMS inertial devices.
Key concepts: Silicon on insulator, Wafer, Microelectromechanical systems, Wafer backgrinding, Materials science, Die preparation, Wafer testing, Optoelectronics