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Analysis of xanthates by negative‐ion fast atom bombardment mass spectrometry

L. Fourie, Hendrik Gerhardus Kruger

Abstract

Abstract A new technique using negative‐ion fast atom bombardment mass spectrometry for the analysis of xanthates and related compounds is described. Electron impact and positive‐ion fast atom bombardment mass spectrometry produced no structurally related fragment ions or observable molecular ions at the expected m/z values. It was demonstrated that negative‐ion fast atom bombardment ionization was the most suitable method of ionization for structure elucidation studies for the compounds described.

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Available abstract

Key concepts: Fast atom bombardment, Mass spectrometry, Ion, Chemistry, Electron ionization, Ionization, Static secondary-ion mass spectrometry, Atom (system on chip)