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2009•Journal of Surface Investigation X-ray Synchrotron and Neutron TechniquesRequires access

The influence of a probe on topographical images in atomic force microscopy

N. G. Tsirkunova, Victor E. Borisenko, Л. В. Кухаренко, Mikhail V. Goltsev, С. А. Чижик

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Abstract

Examples of the errors that arose under the studies of metric characteristics of micro- and nanoobjects with atomic force microscopy (AFM) are presented. Degradation of the tip of the probe both under successive scanning of the same part of a sample surface and in the course of a single scan is revealed. AFM images acquired with the probe having twin apexes located at different levels are demonstrated.

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What this paper is about

Examples of the errors that arose under the studies of metric characteristics of micro- and nanoobjects with atomic force microscopy (AFM) are presented. Degradation of the tip of the probe both under successive scanning of the same part of a sample surface and in the course of a single scan is revealed. AFM images acquired with the probe having twin apexes located at different levels are demonstrated.

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Available abstract

Examples of the errors that arose under the studies of metric characteristics of micro- and nanoobjects with atomic force microscopy (AFM) are presented. Degradation of the tip of the probe both under successive scanning of the same part of a sample surface and in the course of a single scan is revealed. AFM images acquired with the probe having twin apexes located at different levels are demonstrated.

Key concepts: Atomic force microscopy, Scanning probe microscopy, Scanning Force Microscopy, Conductive atomic force microscopy, Microscopy, Scanning capacitance microscopy, Materials science, Non-contact atomic force microscopy

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