1977IEEE Transactions on Aerospace and Electronic SystemsRequires access

A Distributed Intelligence Automatic Test System for PATRIOT

Steven Ring

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Abstract

An automatic test system supporting high volume production testing of diverse state-of-the-art electronic assemblies is described. The test complex consists of a centralized computer system communicating to a network of satellite stations, each structured as "Intelligent Test Centers" dedicated to a particular family of assemblies (e.g., analog, digital, microwave). Allocation of resources and tasks have been distributed for optimum efficiency of production testing. This paper describes the organization and characteristics of the test system. Test center operation is explained with emphasis given to unique man-machine interactive features designed for on-line generation, examination, and maintenance of Unit-Under-Test (UUT) programs. Details are presented of the test language, RATEL, used for UUT programming. Other aspects that are discussed include test data and UUT program characteristics.

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An automatic test system supporting high volume production testing of diverse state-of-the-art electronic assemblies is described. The test complex consists of a centralized computer system communicating to a network of satellite stations, each structured as "Intelligent Test Centers" dedicated to a particular family of assemblies (e.g., analog, digital, microwave). Allocation of resources and tasks have been distributed for optimum efficiency of production testing. This paper describes the organization and characteristics of the test system. Test center operation is explained with emphasis given to unique man-machine interactive features designed for on-line generation, examination, and maintenance of Unit-Under-Test (UUT) programs. Details are presented of the test language, RATEL, used for UUT programming. Other aspects that are discussed include test data and UUT program characteristics.

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Available abstract

An automatic test system supporting high volume production testing of diverse state-of-the-art electronic assemblies is described. The test complex consists of a centralized computer system communicating to a network of satellite stations, each structured as "Intelligent Test Centers" dedicated to a particular family of assemblies (e.g., analog, digital, microwave). Allocation of resources and tasks have been distributed for optimum efficiency of production testing. This paper describes the organization and characteristics of the test system. Test center operation is explained with emphasis given to unique man-machine interactive features designed for on-line generation, examination, and maintenance of Unit-Under-Test (UUT) programs. Details are presented of the test language, RATEL, used for UUT programming. Other aspects that are discussed include test data and UUT program characteristics.

Key concepts: Automatic test equipment, Test (biology), System under test, System testing, Automatic test pattern generation, Computer science, Test Management Approach, Test harness

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