2007MetrologiaRequires access

Low-level gamma-ray spectrometry using Ge-detectors

M. Hult

Open publisher page 44 citations

Abstract

The technological advances that have taken place during the past 45 years in the fabrication of high purity germanium crystals have had a significant impact on low-level gamma-ray spectrometry. Today, Ge-detectors with high purity Ge-crystals of 2 kg are readily available and detectors with crystals up to 5 kg can be produced. Use of large area crystals results in high detection efficiencies, which can serve to reduce detection limits or to make faster measurements of low activity samples possible. The second major development that has contributed to lowering detection limits has been research on identifying and reducing the background components in gamma-ray spectrometry systems. This paper deals with the major technical factors affecting the performance of low-background HPGe-detectors and provides an overview of the major areas of application.

About this research paper

What this paper is about

The technological advances that have taken place during the past 45 years in the fabrication of high purity germanium crystals have had a significant impact on low-level gamma-ray spectrometry. Today, Ge-detectors with high purity Ge-crystals of 2 kg are readily available and detectors with crystals up to 5 kg can be produced. Use of large area crystals results in high detection efficiencies, which can serve to reduce detection limits or to make faster measurements of low activity samples possible. The second major development that has contributed to lowering detection limits has been research on identifying and reducing the background components in gamma-ray spectrometry systems. This paper deals with the major technical factors affecting the performance of low-background HPGe-detectors and provides an overview of the major areas of application.

Why it matters

OpenAlex reports 44 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

The technological advances that have taken place during the past 45 years in the fabrication of high purity germanium crystals have had a significant impact on low-level gamma-ray spectrometry. Today, Ge-detectors with high purity Ge-crystals of 2 kg are readily available and detectors with crystals up to 5 kg can be produced. Use of large area crystals results in high detection efficiencies, which can serve to reduce detection limits or to make faster measurements of low activity samples possible. The second major development that has contributed to lowering detection limits has been research on identifying and reducing the background components in gamma-ray spectrometry systems. This paper deals with the major technical factors affecting the performance of low-background HPGe-detectors and provides an overview of the major areas of application.

Key concepts: Gamma ray spectrometry, Semiconductor detector, Germanium, Detector, Mass spectrometry, Materials science, Fabrication, Gamma spectroscopy

Related papers

Back to paper searchBrowse research topicsOriginal source
Low-level gamma-ray spectrometry using Ge-detectors — Research Paper | ScholarLens