2001•Applied Physics LettersRequires access
Quantitative surface stress measurements using a microcantilever
Michel Godin, Vincent Tabard‐Cossa, Peter Grütter, Peter John Williams
Open publisher page 99 citations
Abstract
A method for calculating the surface stress associated with the deflection of a micromechanical cantilever is presented. This method overcomes some of the limitations associated with Stoney’s formula by circumventing the need to know the cantilever’s Young’s modulus, which can have a high level of uncertainty, especially for silicon nitride cantilevers. The surface stress is calculated using readily measurable cantilever properties, such as its geometry, spring constant, and deflection. The method is applicable to both rectangular and triangular cantilevers. A calibration of the deflection measurement is also presented. The surface stress measurement is accurate to within 4%–7%.