2012Unpublished venueRequires access

Estimation of failure rate and its applications in reliability engineering

Han Ming

Open publisher page 2 citations

Abstract

This article introduces a new parameter estimation method, named E-Bayesian estimation method, to estimate failure rate derived from exponential distribution, in the case of data with only one failure. Firstly, the definition of E-Bayesian estimation is provided. Moreover, formulas of E-Bayesian estimation and hierarchical Bayesian estimation are provided. Secondly, properties of E-Bayesian estimation are discussed. Finally, the calculated results of a practical problem show that the proposed method is feasible and convenient in engineering application.

About this research paper

What this paper is about

This article introduces a new parameter estimation method, named E-Bayesian estimation method, to estimate failure rate derived from exponential distribution, in the case of data with only one failure. Firstly, the definition of E-Bayesian estimation is provided. Moreover, formulas of E-Bayesian estimation and hierarchical Bayesian estimation are provided. Secondly, properties of E-Bayesian estimation are discussed. Finally, the calculated results of a practical problem show that the proposed method is feasible and convenient in engineering application.

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OpenAlex reports 2 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

This article introduces a new parameter estimation method, named E-Bayesian estimation method, to estimate failure rate derived from exponential distribution, in the case of data with only one failure. Firstly, the definition of E-Bayesian estimation is provided. Moreover, formulas of E-Bayesian estimation and hierarchical Bayesian estimation are provided. Secondly, properties of E-Bayesian estimation are discussed. Finally, the calculated results of a practical problem show that the proposed method is feasible and convenient in engineering application.

Key concepts: Bayesian probability, Failure rate, Computer science, Bayes estimator, Estimation, Reliability (semiconductor), Exponential distribution, Bayesian hierarchical modeling

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