E-Bayesian Estimation Method and its Applications in Reliability Engineering
Han Ming
Abstract
Han Ming
Abstract
Evaluation method of reliability of industrial products needs to be improved effectively with the advance of science and technology. This paper introduces a new method, named E-Bayesian estimation method, to estimate failure probability in reliability engineering. The definition of E-Bayesian estimation of the failure probability is provided, moreover, the formulas of E-Bayesian estimation and hierarchical Bayesian estimation of the failure probability were provided, and properties of the E-Bayesian estimation, i.e. relations between E-Bayesian estimation and hierarchical Bayesian estimation, are also provided. Finally, calculation on practical problems shows that the provided method is feasible and easy to perform.
A significance statement is not available in the OpenAlex record.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
Evaluation method of reliability of industrial products needs to be improved effectively with the advance of science and technology. This paper introduces a new method, named E-Bayesian estimation method, to estimate failure probability in reliability engineering. The definition of E-Bayesian estimation of the failure probability is provided, moreover, the formulas of E-Bayesian estimation and hierarchical Bayesian estimation of the failure probability were provided, and properties of the E-Bayesian estimation, i.e. relations between E-Bayesian estimation and hierarchical Bayesian estimation, are also provided. Finally, calculation on practical problems shows that the provided method is feasible and easy to perform.
Key concepts: Bayesian probability, Estimation, Reliability (semiconductor), Bayes estimator, Bayesian hierarchical modeling, Computer science, Bayesian average, Reliability engineering