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New scanning transmission electron microscope microanalytical system

N. W. Parker, Richard K Mittleman, Albert V. Crewe

Open publisher page 3 citations

Abstract

We have designed and built an improved, dedicated analytical scanning transmission electron microscope (STEM). A novel feature of this microscope is a magnetic lens above the accelerating gun, allowing the specimen probe to achieve very high current densities while retaining the high spatial resolution of the STEM. Integrated with this microscope, we have also implemented an image processing system which allows rapid analysis of the digitized microscope output signals. This processing system also allows the graphic simulation of planar materials (such as intercalated graphite) to derive diffraction pattern simulations for comparison with the experimental data. An image database system allows over 2000 images to be easily managed.

About this research paper

What this paper is about

We have designed and built an improved, dedicated analytical scanning transmission electron microscope (STEM). A novel feature of this microscope is a magnetic lens above the accelerating gun, allowing the specimen probe to achieve very high current densities while retaining the high spatial resolution of the STEM. Integrated with this microscope, we have also implemented an image processing system which allows rapid analysis of the digitized microscope output signals. This processing system also allows the graphic simulation of planar materials (such as intercalated graphite) to derive diffraction pattern simulations for comparison with the experimental data. An image database system allows over 2000 images to be easily managed.

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OpenAlex reports 3 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

We have designed and built an improved, dedicated analytical scanning transmission electron microscope (STEM). A novel feature of this microscope is a magnetic lens above the accelerating gun, allowing the specimen probe to achieve very high current densities while retaining the high spatial resolution of the STEM. Integrated with this microscope, we have also implemented an image processing system which allows rapid analysis of the digitized microscope output signals. This processing system also allows the graphic simulation of planar materials (such as intercalated graphite) to derive diffraction pattern simulations for comparison with the experimental data. An image database system allows over 2000 images to be easily managed.

Key concepts: Microscope, Conventional transmission electron microscope, Scanning transmission electron microscopy, Lens (geology), Optics, Materials science, Scanning Hall probe microscope, Scanning electron microscope

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