1985Journal of Applied PhysicsRequires access

Study of forward I - V plot for Schottky diodes with high series resistance

Kazunori Satō, Y. Yasumura

Open publisher page 164 citations

Abstract

The current-voltage characteristics for Schottky barrier diodes with series resistance are discussed. It is shown that by using Norde’s function F(V)=V/2−(kT/q)ln(I/SAT2) at two different temperatures, barrier height, n-value or ideality factor, and series resistance can be determined even in the case 1

About this research paper

What this paper is about

The current-voltage characteristics for Schottky barrier diodes with series resistance are discussed. It is shown that by using Norde’s function F(V)=V/2−(kT/q)ln(I/SAT2) at two different temperatures, barrier height, n-value or ideality factor, and series resistance can be determined even in the case 1

Why it matters

OpenAlex reports 164 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

The current-voltage characteristics for Schottky barrier diodes with series resistance are discussed. It is shown that by using Norde’s function F(V)=V/2−(kT/q)ln(I/SAT2) at two different temperatures, barrier height, n-value or ideality factor, and series resistance can be determined even in the case 1

Key concepts: Equivalent series resistance, Schottky diode, Diode, Schottky barrier, Series (stratigraphy), Chemistry, Optoelectronics, Materials science

Related papers

Back to paper searchBrowse research topicsOriginal source
Study of forward I - V plot for Schottky diodes with high series resistance — Research Paper | ScholarLens