Silicon-on-insulator optical intensity modulatorbased on waveguide-vanishing effect
Chengzhi Zhao, E.K. Liu, Ganke Li, L. Jay Guo
Abstract
Chengzhi Zhao, E.K. Liu, Ganke Li, L. Jay Guo
Abstract
A silicon-on-insulator (SOI) optical intensity modulator has been proposed and fabricated, and is based on the large cross-section singlemode rib waveguide condition, the waveguide-vanishing effect and the free-carrier plasma dispersion effect. In the modulator the SOI technique uses silicon and silicon dioxide thermal bonding and back-polishing. The insertion loss of the device is measured to be 3.65 dB at a wavelength of 1.3 µm. The modulation depth is 96% at an injection current of 45 mA. Response time is ~160 ns.
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A silicon-on-insulator (SOI) optical intensity modulator has been proposed and fabricated, and is based on the large cross-section singlemode rib waveguide condition, the waveguide-vanishing effect and the free-carrier plasma dispersion effect. In the modulator the SOI technique uses silicon and silicon dioxide thermal bonding and back-polishing. The insertion loss of the device is measured to be 3.65 dB at a wavelength of 1.3 µm. The modulation depth is 96% at an injection current of 45 mA. Response time is ~160 ns.
Key concepts: Silicon on insulator, Materials science, Waveguide, Optical modulator, Optics, Silicon, Electro-optic modulator, Optoelectronics