2000•Microelectronics ReliabilityRequires access

Overstress and electrostatic discharge in CMOS and BCD integrated circuits

Gaudenzio Meneghesso, Mauro Ciappa, P. Malberti, Louis Sponton, Giuseppe Croce, Claudio Contiero, Enrico Zanoni

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Key concepts: Electrostatic discharge, Robustness (evolution), CMOS, Electronic engineering, Engineering, Electronic circuit, Integrated circuit, Reliability engineering

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Overstress and electrostatic discharge in CMOS and BCD integrated circuits — Research Paper | ScholarLens