2013•Nanotechnologies in RussiaRequires access

Investigation into the effect of cantilever structural parameters on the sensitivity of magnetic force microscopy

Yu. A. Chaplygin, V. I. Shevyakov

Abstract

The results of a study into the effect of cantilever structural parameters on the sensitivity of magnetic force microscopy (MFM) have been presented. It has been shown that it is necessary to use cantilevers with an optimal thickness of the magnetic coating and hardness of the beam lying in the range from 0.1 to 1.0 N/m in order to ensure the maximum sensitivity of the method. The use of these cantilevers makes it possible to register locally arranged single-domain iron particles ∼50 nm in size.

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Available abstract

Key concepts: Cantilever, Magnetic force microscope, Sensitivity (control systems), Materials science, Atomic force microscopy, Coating, Microscopy, Range (aeronautics)