2013•Thin Solid FilmsRequires access

Scanning probe study on the photovoltaic characteristics of a Si solar cell by using Kelvin force microscopy and photoconductive atomic force microscopy

Jinhee Heo, Soonho Won

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Key concepts: Kelvin probe force microscope, Photoconductive atomic force microscopy, Conductive atomic force microscopy, Photoconductivity, Microscopy, Materials science, Scanning electron microscope, Optoelectronics