1992•Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIERequires access
Subsurface profile refinement for neutron specular reflectivity (Invited Paper)
John F. Ankner, C. F. Majkrzak
Open publisher page 60 citations
Abstract
The importance of modeling in the analysis of neutron and x-ray reflectivity data cannot be overstated. For specular reflectivity, the theory is straightforward and one merely needs a flexible pattern for constructing density profiles. We will describe the parameters used in and the limitations of such models.