1981•Journal of Applied CrystallographyRequires access
Refraction corrections to the diffractometer angles of centered reflections from extended-face single crystals
Garry J. McIntyre
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Abstract
The effect of refraction on the observed diffractometer angles θr, ωr and χr of a centered reflection is discussed for general asymmetric reflection from a finitely absorbing extended-face crystal. Formulae are presented for θr, ωr and χr for symmetric reflection and for θr and ωr for the two extreme positions of asymmetric reflection in terms of the angles calculated assuming that refraction can be neglected.