Conversion of a double crystal diffractometer to a high resolution triple crystal diffractometer
R. J. Matyi
Abstract
R. J. Matyi
Abstract
The conversion of a commercial double crystal x-ray diffractometer to a flexible, high-resolution triple crystal diffractometer is described. This conversion, which has been accomplished at low cost, greatly enhances the flexibility of a double crystal diffractometer for the characterization of both highly perfect and relatively imperfect bulk single crystals and epitaxial layers. The conversion is easily reversible, thus allowing a single double crystal diffractometer to operate in either a double crystal or triple crystal mode. Specific examples of the capabilities of this instrument are presented.
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The conversion of a commercial double crystal x-ray diffractometer to a flexible, high-resolution triple crystal diffractometer is described. This conversion, which has been accomplished at low cost, greatly enhances the flexibility of a double crystal diffractometer for the characterization of both highly perfect and relatively imperfect bulk single crystals and epitaxial layers. The conversion is easily reversible, thus allowing a single double crystal diffractometer to operate in either a double crystal or triple crystal mode. Specific examples of the capabilities of this instrument are presented.
Key concepts: Diffractometer, Crystal (programming language), Materials science, Crystallography, Single crystal, Resolution (logic), Crystal structure, Optics