2012•Review of Scientific InstrumentsRequires access
Note: Grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry
Volker Körstgens, R. Meier, Matthias A. Ruderer, Shuai Guo, H.-Y. Chiang, Jan Perlich, Stephan Volkher Roth, Rainer Gehrke, Peter Müller‐Buschbaum
Open publisher page 7 citations
Abstract
The combination of grazing incidence small angle x-ray scattering (GISAXS) and grazing incidence wide angle x-ray scattering (GIWAXS) with optical imaging ellipsometry is presented as an upgrade of the available measurement techniques at the wiggler beamline BW4 of the Hamburger Synchrotronstrahlungslabor. The instrument is introduced with the description of the alignment procedure to assure the measurement of imaging ellipsometry and GISAXS∕GIWAXS on the same sample spot. To demonstrate the possibilities of the new instrument examples of morphological investigation on films made of poly(3-hexylthiophene) and [6,6]-phenyl-C(61) butyric acid methyl ester as well as textured poly(9,9-dioctylfluorene-alt-benzo-thia-diazole) are shown.