Facility of Chinese Synchrotron Radiation Small Angle X-Ray Scattering
Zhi Li
Abstract
Zhi Li
Abstract
Small angle Xray scattering (SAXS) originates from spatial fluctuations of the electronic density within a material. It is ideally suitable for investigating the geometric structure of inhomogeneous material containing regions in which fluctuation or variation in electron density extends over distances of about 0.4nm to 200nm (e.g. particulate or porous materials). The Xray intensity emitting from common Xray source is always very low, so that the application of SAXS is limited. By using synchrotron radiation with high intensity as Xray source, SAXS measurement can be well improved. This short paper introduces the facility of Chinese synchrotron radiation small angle Xray scattering.
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Small angle Xray scattering (SAXS) originates from spatial fluctuations of the electronic density within a material. It is ideally suitable for investigating the geometric structure of inhomogeneous material containing regions in which fluctuation or variation in electron density extends over distances of about 0.4nm to 200nm (e.g. particulate or porous materials). The Xray intensity emitting from common Xray source is always very low, so that the application of SAXS is limited. By using synchrotron radiation with high intensity as Xray source, SAXS measurement can be well improved. This short paper introduces the facility of Chinese synchrotron radiation small angle Xray scattering.
Key concepts: Small-angle X-ray scattering, Synchrotron radiation, Scattering, Synchrotron, Small-angle scattering, X-ray, High-energy X-rays, Electron density