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Microstructural examination of layered coatings by scanning electron microscopy, transmission electron microscopy, and atomic force microscopy

D.G. Rickerby, T. Friesen

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Key concepts: Materials science, Transmission electron microscopy, Energy filtered transmission electron microscopy, Scanning confocal electron microscopy, Microscopy, Electron microscope, Conventional transmission electron microscope, Scanning transmission electron microscopy

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Microstructural examination of layered coatings by scanning electron microscopy, transmission electron microscopy, and atomic force microscopy — Research Paper | ScholarLens