2007•Journal of Electronic MaterialsRequires access

Secondary Ion Mass Spectrometry and Time-of-Flight Secondary Ion Mass Spectrometry Study of Impurity Measurements in HgCdTe

Steve Price, Larry Wang, Alice Wang, Arwa S. Ginwalla, Ian Mowat

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Key concepts: Secondary ion mass spectrometry, Mass spectrometry, Impurity, Time of flight, Analytical Chemistry (journal), Ion, Chemistry, Static secondary-ion mass spectrometry

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Secondary Ion Mass Spectrometry and Time-of-Flight Secondary Ion Mass Spectrometry Study of Impurity Measurements in HgCdTe — Research Paper | ScholarLens