2018•Bulletin of the American Physical SocietyRequires access

Scattering-Type Scanning Near-Field Optical Microscopy for Optical Microscopy and Spectroscopy at the Nanoscale

Max Eisele, Adrian Cernescu, Nicolai F. Hartmann

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Key concepts: Microscopy, Nanoscopic scale, Optical microscope, Materials science, Spectroscopy, Near-field scanning optical microscope, Optics, Scattering

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Scattering-Type Scanning Near-Field Optical Microscopy for Optical Microscopy and Spectroscopy at the Nanoscale — Research Paper | ScholarLens